Frequency modulation torsional resonance mode AFM on chlorite (001)
Proceedings of the 17th International Vacuum Congress/13th International Conference on Surface Science/International Conference on Nanoscience and Technology 100: 4855
In this paper, we discuss torsional resonance mode atomic force microscopy in frequency modulation (FM-TR-AFM) under ambient conditions. Freshly cleaved chlorite (001) exhibiting brucite-like and mica-like surface areas was investigated in constant amplitude operation in order to visualize topography and frictional properties. The measurements in frequency modulation allow the characterization of dissipative effects due to changes in the lateral forces between tip and sample.