Sektion Kristallographie

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Determination of domain distribution by analysis of LEED beam profiles

Fourth International Conference on Solid Surfaces and the Third European Conference on Surface Science, Vol. II; Cannes; France; 22-26 Sept. 1980: 1295-1298

Autoren/Herausgeber: Moritz W
Wolf D
Erschienen: 1980

Angular profiles of LEED beams from Au(110)-(1 x 2) have been measured and analyzed with respect to shape, half-widths and energy dependence of half-widths. Beam broadening is mainly caused by steps. The distribution of terrace widths has been determined, analyzing the shape of the profiles which have been found to be well described by a Cauchy function. This profile is caused by an exponential decrease of domain size probabilities.