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A novel procedure for fast surface structural analysis based on LEED intensity data

Surface Science Letters 219(3): L637-L645

Autoren/Herausgeber: Kleinle G
Moritz W
Adams DL
Ertl G
Erschienen: 1989

By evaluating LEED intensities from different diffraction beams taken only at discrete energy intervals (which may be as large as 15-20 eV) the same degree of reliability in surface structure determination can be reached as with the conventional techniques based on analysis of continuous I/V-spectra. The minimum of the corresponding R-factor can be found by a least-squares fit method, as will be exemplified with a system in which 8 structural parameters were subject to simultaneous refinement.

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