Eg versus x relation from photoluminescence and electron microprobe investigations in p-type Hg1-xCdxTe (0.35 [less-than-or-equals, slant] x [less-than-or-equals, slant] 0.7)
Journal of Crystal Growth 86(1-4): 593-598
Combined photoluminescence (at 10 [less-than-or-equals, slant] T [less-than-or-equals, slant] 300 K) and electron microprobe investigations have been carried out with HgCdTe samples grown from the melt or from solution. By exciting the samples through metallic masks with 200 [mu]m diameter holes fixed with respect to the sample care was taken to pick-up both characteristic X-ray radiation as well as the photoluminescence from the same sample area. The Eg versus x relation determined in this way at T = 30 K has been compared with data from the interband absorption edge by other authors.