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Response of a laterally vibrating nanotip to surface forces

Applied Physics Letters 91(25): 253120

Autoren/Herausgeber: Yurtsever A
Gigler AM
Macias E
Stark RW
Erschienen: 2007
The torsional eigenmodes of atomic force microscope (AFM) cantilevers are highly sensitive toward in-plane material properties of the sample. We studied the effect of viscosity and lateral contact stiffness on the detuning, amplitude, and phase response numerically. To verify the theoretical considerations, a torsion mode AFM was operated in frequency modulation. During approach and retract cycles, we observed a negative detuning of the torsional resonant frequency close to the sample surface depending on the tilt angle between the tip and the sample. Thus, the tilt has a significant effect on the imaging process in torsional resonance mode. (c) 2007 American Institute of Physics.

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