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Growth of Bi thin films on quasicrystal surfaces

Physical Review B 78(15): 155416

Autoren/Herausgeber: Sharma HR
Fournee V
Shimoda M
Ross AR
Lograsso TA
Gille P
Tsai AP
Erschienen: 2008

We present a comprehensive study of Bi thin-film growth on quasicrystal surfaces. The substrates used for the growth are the fivefold surface of icosahedral (i)-Al-Cu-Fe and i-Al-Pd-Mn and the tenfold surface of decagonal (d)-Al-Ni-Co quasicrystals. The growth is investigated at 300 and 525 K substrate temperatures and at different coverage (theta) ranging from submonolayer to ten monolayers. The film is characterized by scanning tunneling microscopy, reflection high-energy electron diffraction, and x-ray photoelectron spectroscopy. At 300 K, the deposited Bi yields a quasicrystalline film for theta

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