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Evaluation of nanoscale roughness measurements on a plasma treated SU-8 polymer surface by atomic force microscopy

Applied Surface Science 254(22): 7290-7295

Autoren/Herausgeber: Walther F
Heckl WM
Stark RW
Erschienen: 2008

A comparison between roughness data obtained with an atomic force microscope (AFM) on different surfaces requires reliable roughness parameters. In order to specify the appropriate parameters for nanoscale roughness measurements, we compared the root mean square (rms) roughness and the relative surface area (sdr) as function of varying scan size, speed and pixel size. By using oxygen plasma (24 kJ) treated SU-8 with an average rms roughness of 2.6 +/- 0.5 nm as reference surface, the repeatability of the method was evaluated for dynamic (tapping) and contact mode. The evaluation of AFM images indicated a decrease of the effective tip radius after a few measurements. This degradation of the tip lowers the resolution of the image and can affect roughness measurements. (C) 2008 Elsevier B.V. All rights reserved.

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