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Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface

Ultramicroscopy 109(3): 275-279

Autoren/Herausgeber: Yurtsever A
Gigler AM
Stark RW
Erschienen: 2009

Scanning probe imaging in a shear force mode allows for the characterization of in-plane surface properties. In a standard AFM, shear force imaging can be realized by the torsional resonance mode. In order to investigate the imaging conditions on mineral surfaces, a torsional resonance mode atomic force microscope was operated in amplitude (AM) and frequency modulation (FM) feedback. Freshly cleaved chlorite was investigated, which showed brucite-like and talc-like surface areas. In constant amplitude FM mode, a slight variation in energy dissipation was observed between both surfaces. Amplitude and frequency vs. distance curves revealed that the tip was in repulsive contact with the specimen during imaging. (C) 2008 Elsevier B.V. All rights reserved.

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